Series is a low cost 1 site to 64 site flash memory production wafersort and post-
assembly test system. The system performs DC and functional tests on non-volatile
memory devices. Novtek's unique architecture incorporates two pattern
generators. The system consists of a software based algorithmic pattern generator
and a high speed 10MHz hardware based pattern generator for high throughput production
testing. The NTS600 Series utilizes a tester per DUT architecture with no shared
resources between devices. Complete DC parametric and functional tests are performed in
parallel on up to 64 devices.
Each test site includes a
10MHz pattern generator, 56 channels, parametric measurement unit, 4 programmable DUT
supplies, timers and redundancy analysis capability. Upgrades include buffer memory,
72 channels with option upgrade,32 data channels and cell current measurement
capability. Test capabilities include continuity, leakage, drive, data pattern
write/erase/verify functions, write/erase time measurements, Vt, margin and redundancy
repair. Each test site is comprised of one card. The tester per card
architecture increases reliability by eliminating connectors within a test site.
Production line problems are quickly remedied by replacing a test card.